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1

[ACM Press the 50th Annual Design Automation Conference - Austin, Texas (2013.05.29-2013.06.07)] Proceedings of the 50th Annual Design Automation Conference on - DAC '13 - On effective and efficient in-field TSV repair for stacked 3D ICs

Jiang, Li, Ye, Fangming, Xu, Qiang, Chakrabarty, Krishnendu, Eklow, Bill

Year:

2013

Language:

english

File:

PDF, 425 KB

english, 2013

2

Major Milestones for Two IEEE Standards Groups in 2011

Journal:

IEEE Design & Test of Computers

Year:

2011

Language:

english

File:

PDF, 447 KB

english, 2011

3

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - IEEE P1687: Toward Standardized Access of Embedded Instrumentation

Posse, Ken, Crouch, Al, Rearick, Jeff, Eklow, Bill, Laisne, Mike, Bennetts, Ben, Doege, Jason, Ricchetti, Mike, Cote, J-f

Year:

2006

Language:

english

File:

PDF, 9.88 MB

english, 2006

4

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs

Wang, Ran, Chakrabarty, Krishnendu, Eklow, Bill

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 3.30 MB

english, 2014

5

[IEEE 2012 17th Asia and South Pacific Design Automation Conference (ASP-DAC) - Sydney, Australia (2012.01.30-2012.02.2)] 17th Asia and South Pacific Design Automation Conference - Yield enhancement for 3D-stacked ICs: Recent advances and challenges

Xu, Qiang, Jiang, Li, Huiyun Li,, Eklow, Bill

Year:

2012

Language:

english

File:

PDF, 116 KB

english, 2012

6

[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - No Fault Found: The root cause

Larsson, Erik, Eklow, Bill, Davidsson, Scott, Aitken, Rob, Jutman, Artur, Lotz, Christophe

Year:

2015

Language:

english

File:

PDF, 103 KB

english, 2015

7

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs

Sadi, Mehdi, Conroy, Zoe, Eklow, Bill, Kamm, Matthias, Bidokhti, Nematollah, Tehranipoor, Mark Mohammad

Year:

2014

Language:

english

File:

PDF, 1.76 MB

english, 2014

8

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Test Economics ¿ What can a Board/System Test Engineer do to Influence Supply Operation Metrics

Tourangeau, Sylvain, Eklow, Bill

Year:

2006

Language:

english

File:

PDF, 278 KB

english, 2006

9

On Effective Through-Silicon Via Repair for 3-D-Stacked ICs

Jiang, Li, Xu, Qiang, Eklow, Bill

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 9.67 MB

english, 2013

10

Recap of the ITC15 Test Conference

Journal:

IEEE Design and Test

Year:

2016

Language:

english

File:

PDF, 72 KB

english, 2016

11

A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3D-Stacked ICs

Agrawal, Mukesh, Chakrabarty, Krishnendu, Eklow, Bill

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 2.36 MB

english, 2015

12

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Boundary-scan: Built to last? Panel synopsis

Year:

2007

Language:

english

File:

PDF, 42 KB

english, 2007

13

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Re-using chip level DFT at board level

Gu, Xinli, Rearick, Jeff, Eklow, Bill, Keim, Martin, Qian, Jun, Jutman, Artur, Chakrabarty, Krishnendu, Larsson, Erik

Year:

2012

Language:

english

File:

PDF, 101 KB

english, 2012

14

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FALCON: Rapid statistical fault coverage estimation for complex designs

Mirkhani, Shahrzad, Abraham, Jacob A., Vo, Toai, Jun, Hongshin, Eklow, Bill

Year:

2012

Language:

english

File:

PDF, 838 KB

english, 2012

15

[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs

Wang, Ran, Chakrabarty, Krishnendu, Eklow, Bill

Year:

2013

Language:

english

File:

PDF, 1.11 MB

english, 2013

16

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs

Agrawal, Mukesh, Chakrabarty, Krishnendu, Eklow, Bill

Year:

2014

Language:

english

File:

PDF, 536 KB

english, 2014

17

[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - No Fault Found: The root cause

Larsson, Erik, Eklow, Bill, Davidsson, Scott, Aitken, Rob, Jutman, Artur, Lotz, Christophe

Year:

2015

File:

PDF, 103 KB

2015

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